Request for Tenders under Open (OJEU) Procedure for the Supply, Delivery and Installation of a Broad Ion Beam Milling System for SP&S for the Tyndall National Institute, UCC
The Specialty Products & Services Group (SP&S) at Tyndall National Institute, UCC, fabricate a wide variety of Semiconductor devices, ranging from traditional Silicon microelectronics and Silicon MEMS to III-V photonic devices. In addition, SP&S provide an extensive array of analysis services in all types of electronic devices and packages to internal and external customers. The Electron Microscopy and Analysis Facility (EMAF) within SP&S utilise a wide range of SEM, TEM and FIB equipment as part of these analysis services. We wish to extend our capability in the area of sample preparation by purchasing a fully functional Broad Ion Beam (BIB) milling system with an ancillary mechanical polishing system which will allow us to bridge a sample cross-section preparation gap between our existing plasma FIB and mechanical methods
Deadline
The time limit for receipt of tenders was 2022-05-10.
The procurement was published on 2022-04-04.
Suppliers
The following suppliers are mentioned in award decisions or other procurement documents:
Contract notice (2022-04-04) Object Scope of the procurement
Title: Miscellaneous equipment
Reference number: UCC/2022/02
Short description:
“The Specialty Products & Services Group (SP&S) at Tyndall National Institute, UCC, fabricate a wide variety of Semiconductor devices, ranging from...”
Short description
The Specialty Products & Services Group (SP&S) at Tyndall National Institute, UCC, fabricate a wide variety of Semiconductor devices, ranging from traditional Silicon microelectronics and Silicon MEMS to III-V photonic devices. In addition, SP&S provide an extensive array of analysis services in all types of electronic devices and packages to internal and external customers. The Electron Microscopy and Analysis Facility (EMAF) within SP&S utilise a wide range of SEM, TEM and FIB equipment as part of these analysis services. We wish to extend our capability in the area of sample preparation by purchasing a fully functional Broad Ion Beam (BIB) milling system with an ancillary mechanical polishing system which will allow us to bridge a sample cross-section preparation gap between our existing plasma FIB and mechanical methods
“Refer to RFT”
Source: OJS 2022/S 070-183383 (2022-04-04)
Contract award notice (2022-09-07) Object Scope of the procurement
Total value of the procurement: 211 500 EUR 💰
Notice metadata
Document type: Contract award notice