Analytical Scanning Electron Microscope (SEM)
A high specification analytical scanning electron microscope/bench with integrated,
EDX and Confocal Raman is required. This system should be designed primarily for automated Geological analysis.
Deadline
The time limit for receipt of tenders was 2016-04-19.
The procurement was published on 2016-03-10.
Suppliers
The following suppliers are mentioned in award decisions or other procurement documents:
Who?
What?
Where?
Procurement history
| Date |
Document |
| 2016-03-10
|
Contract notice
|
| 2016-10-06
|
Contract award notice
|