TEM specimen preparation system (Ion Mill)
An Ion Mill Ideal for producing the highest quality specimens for Transmission Electron Microscopy (TEM).
Deadline
The time limit for receipt of tenders was 2015-05-26.
The procurement was published on 2015-04-15.
Who?
What?
Where?
Procurement history
| Date |
Document |
| 2015-04-15
|
Contract notice
|