PROMIC201302 - Environmental scanning probe microscope (SPM) system
A large-sample, automated Scanning Probe Microscope is required, with integrated environmental control of the sample during AFM imaging at a level of oxygen and water guaranteed below 1ppm. The instrument must be equipped with nano-scale mapping modes for characterisation of a range of electrical and mechanical properties. Photoconductive AFM imaging under AM1.5 conditions is mandatory within the environmental glovebox.
Deadline
The time limit for receipt of tenders was 2013-05-01.
The procurement was published on 2013-03-12.
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Procurement history
| Date |
Document |
| 2013-03-12
|
Contract notice
|